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Other Surface Analysis Techniques Offered at BIOMETROLOGY

  • Optical Profilometry


Description: Wyko/Veeco, NT 3300


Non-contact, 3-D surface imaging to 1 mm lateral and 0.3 nm vertical resolutions. Analysis of sample areas as large as multiple square centimeters.


  • X-Ray Photoelectron Spectroscopy (XPS/ESCA)


Description: Thermo VG Scientific, ESCALAB 250


Quantitative surface analysis of elemental and chemical state composition and depth profile to 3000 ppm detection limit, 0.45 eV energy resolution, and 3000 nm lateral resolution. Temperature control between -100 degC to +725 degC.


  • Scanning Electron Microscopy (SEM+EDS)


Description: LEO, 1530VP + Oxford EDX option


Surface imaging of conductive and non-conductive samples at magnifications up to 500,000X at 1 nm resolution. EDS quantitative microanalysis to 1000 ppm, elemental mapping to 1 mm resolution.


  • Secondary Ion Mass Spectrometry (SIMS)


Description: ION-TOF, TOF-SIMS


  • Ultrathin Sectioning


Description: Leica, ULTRACUT with cryo option


Optical Profilometry

Scanning Electron Microscopy

X-Ray Photoelectron Spectroscopy


Biometrology    |    1448 E. 52nd Street, Suite 372    |    Chicago, IL 60615 (USA)    |    Tel: +1 (510) 676-5191    |   Email:

©1999 - 2016 Biometrology. All rights reserved


1448 E. 52nd Street, Suite 372

Chicago, IL 60615 (USA)

Tel: +1 (510) 676-5191