Other Surface Analysis Techniques Offered at BIOMETROLOGY
- Optical Profilometry
- Description: Wyko/Veeco, NT 3300
- Non-contact, 3-D surface imaging to 1 mm lateral and 0.3 nm vertical resolutions. Analysis of sample areas as large as multiple square centimeters.
- X-Ray Photoelectron Spectroscopy (XPS/ESCA)
- Description: Thermo VG Scientific, ESCALAB 250
- Quantitative surface analysis of elemental and chemical state composition and depth profile to 3000 ppm detection limit, 0.45 eV energy resolution, and 3000 nm lateral resolution. Temperature control between -100 degC to +725 degC.
- Scanning Electron Microscopy (SEM+EDS)
- Description: LEO, 1530VP + Oxford EDX option
- Surface imaging of conductive and non-conductive samples at magnifications up to 500,000X at 1 nm resolution. EDS quantitative microanalysis to 1000 ppm, elemental mapping to 1 mm resolution.
- Secondary Ion Mass Spectrometry (SIMS)
- Description: ION-TOF, TOF-SIMS
- Ultrathin Sectioning
- Description: Leica, ULTRACUT with cryo option
Contact BIOMETROLOGY for pricing
Optical Profilometry
Scanning Electron Microscopy